Imbalzano, GiulioAnelli, AndreaGiofré, DanieleKlees, SinjaBehler, JörgCeriotti, Michele2018-05-022018-05-022018-05-02201810.1063/1.5024611https://infoscience.epfl.ch/handle/20.500.14299/146270Automatic selection of atomic fingerprints and reference configurations for machine-learning potentialstext::journal::journal article::research article