Gaisch, R.Gimzewski, J. K.Reihl, B.Schlittler, R. R.Tschudy, M.Schneider, W. D.2007-06-202007-06-202007-06-20199210.1016/0304-3991(92)90495-6https://infoscience.epfl.ch/handle/20.500.14299/8868Low-Temperature Ultra-High-Vacuum Scanning Tunneling Microscopetext::journal::journal article::research article