Retention Time Characterization of Commercial DRAM Modules Using an FPGA-based Test Platform

Karakonstantis, GeorgiosConstantin, Jeremy Hugues-FelixBurg, Andreas PeterPignat, Eliéva Arlette2017-02-242017-02-242017-02-242014https://infoscience.epfl.ch/handle/20.500.14299/134797Retention Time Characterization of Commercial DRAM Modules Using an FPGA-based Test Platformstudent work::semester or other student projects