Alfier, A.Behn, R.Nielsen, P.Pasqualotto, R.Zhuang, G.Martin, Y.Schombourg, K.2008-05-132008-05-132008-05-132005https://infoscience.epfl.ch/handle/20.500.14299/25396Influence of ELMs on Edge Temperature and Density Profiles in TCVtext::conference output::conference paper not in proceedings