Hansma, P. K.Schitter, G.Fantner, G. E.Prater, C.2010-11-052010-11-052010-11-05200610.1126/science.1133497https://infoscience.epfl.ch/handle/20.500.14299/56741WOS:000241557800029Applied physics - High-speed atomic force microscopytext::journal::journal article::research article