Alper, CemLattanzio, LivioDe Michielis, LucaPalestri, PierpaoloSelmi, LucaIonescu, Adrian Mihai2013-09-182013-09-182013-09-18201310.1109/TED.2013.2274198https://infoscience.epfl.ch/handle/20.500.14299/94679WOS:000323640300008The electron-hole bilayer tunnel field-effect transistor (EHBTFET) is an electronic switch that uses 2-D-2-D sub-band-to-sub-band tunneling (BTBT) between electron and hole inversion layers and shows significant subthermal swing over several decades of current due to the step-like 2-D density of states behavior. In this paper, EHBTFET has been simulated using a quantum mechanical model. The model results are compared against transactions on computer-aided design simulations and remarkable differences show the importance of quantum effects and dimensionality in this device. Ge EHBTFET with channel thickness of 10 nm results as a promising device for low supply voltage, subthreshold logic applications, with a super steep switching behavior featuring SSavg similar to 40 mV/dec up to V-DD. Furthermore, it has been demonstrated that high ON current levels (similar to 40 mu A/mu m) can be achieved due to the transition from phonon-assisted BTBT to direct BTBT at higher biases.2-D-2-D tunnelingband-to-band tunneling (BTBT)density of states (DOS)electron-hole bilayer tunnel field-effect transistor (EHBTFET)germaniumquantum mechanical (QM) simulationsubthreshold slopetunnel field-effect transistor (TFET)text::journal::journal article::research article