Radenovic, A.Bystrenova, E.Libioulle, L.Valle, F.Shubeita, G. T.Kasas, S.Dietler, G.2007-06-202007-06-202007-06-20200310.1063/1.1604952https://infoscience.epfl.ch/handle/20.500.14299/9084WOS:0001854196000804243Characterization of atomic force microscope probes at low temperaturestext::journal::journal article::research article