Leifer, KBuffat, PABöni, PElsenhans, OFriedli, HPGrimmer, HAnderson, IS2007-02-152007-02-152007-02-151994https://infoscience.epfl.ch/handle/20.500.14299/2819WOS:A1994BE09Y00091Microstructural characterization of Ni/Ti multilayers with TEM, EDS and PEELStext::conference output::conference proceedings::conference paper