Measuring amplitude and phase of light emerging from microstructures with the high resolution interference microscope

Kim, Myun SikScharf, ToralfHerzig, Hans Peter2010-12-132010-12-132010-12-132010https://infoscience.epfl.ch/handle/20.500.14299/62085Measuring amplitude and phase of light emerging from microstructures with the high resolution interference microscopetext::conference output::conference presentation