deAlmeida, P.Schaeublin, R.Almazouzi, A.Victoria, M.Levy, F.2008-04-182008-04-182008-04-182000https://infoscience.epfl.ch/handle/20.500.14299/23226LRP 661Microstructure and growth modes of stoichiometric NiAl and Ni3Al thin films deposited by rf-magnetron sputteringtext::report