Pache, ChristopheVilliger, MartinRutishauser, SimonLeitgeb, Rainer A.Lasser, Theo2009-10-272009-10-272009https://infoscience.epfl.ch/handle/20.500.14299/43903Based on a Debye integral approach, we engineered an extended focal field distribution for Fourier domain optical coherence microscopy. This simulation optimizes beam con- figurations for high lateral resolution combined with extended depth of field.Engineering of Extended Focii for Optical Coherence Microscopytext::conference output::conference poster not in proceedings