Lange, J.Toll, S.Hult, A.MÃ¥nson, J.-A. E.2006-06-262006-06-262006-06-26199510.1016/0032-3861(95)97876-Hhttps://infoscience.epfl.ch/handle/20.500.14299/232177WOS:A1995RP16100011Residual stress build-up in thermoset films cured above their ultimate glass transition temperaturetext::journal::journal article::research article