Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Process

Veerappan, C.Richardson, J.Walker, R.Li, D. U.Fishburn, M. W.Stoppa, D.Borghetti, F.Maruyama, Y.Gersbach, M.Henderson, R. K.Bruschini, C.Charbon, E.2012-06-122012-06-122012-06-12201110.1109/essderc.2011.6044167https://infoscience.epfl.ch/handle/20.500.14299/81694Characterization of Large-Scale Non-Uniformities in a 20k TDC/SPAD Array Integrated in a 130nm CMOS Processtext::conference output::conference proceedings::conference paper