Dinan, T. E.Landolt, DRuterana, PBuffat, PA2007-02-152007-02-152007-02-15199010.1557/PROC-199-281https://infoscience.epfl.ch/handle/20.500.14299/2712Rapid preparation of cross-sectional TEM samples from electroplated coppertext::journal::journal article::research article