Ballif, J.Gianotti, R.Chavanne, P.Walti, R.Salathe, R. P.2009-01-202009-01-202009-01-20199710.1364/OL.22.000757https://infoscience.epfl.ch/handle/20.500.14299/34051WOS:A1997XC13700003Rapid and scalable scans at 21 m/s in optical low-coherence reflectometrytext::journal::journal article::research article