Quantitative determination on the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopy

Foeth, MStadelmann, PABuffat, PA2007-02-152007-02-152007-02-15199910.1016/S0304-3991(98)00060-6https://infoscience.epfl.ch/handle/20.500.14299/2928WOS:000077936900002Quantitative determination on the temperature dependence of the thickness of ferroelectric domain walls using weak beam transmission electron microscopytext::conference output::conference proceedings::conference paper