Defect structure in micropillars using X-ray microdiffraction
2006
Details
Title
Defect structure in micropillars using X-ray microdiffraction
Author(s)
Maass, R. ; Grolimund, D. ; Van Petegem, S. ; Willimann, M. ; Jensen, M. ; Van Swygenhoven, H. ; Lehnert, T. ; Gijs, M.A.M. ; Volkert, C.A. ; Lilleodden, E.T. ; Schwaiger, R.
Published in
Applied Physics Letters
Volume
89
Pages
151905
Date
2006
Other identifier(s)
View record in Web of Science
Laboratories
LMIS2
Record Appears in
Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LMIS2 - Microsystems Laboratory 2
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2006-12-19