Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density
Stanisavljevic, Milos; Schmid, Alexandre; Leblebici, Yusuf
2006

Files

Abstract

An assessment of the fault-tolerance properties of single-ended and differential signaling is shown in the context of a high defect density environment, using a robust error-absorbing circuit architecture. A software tool based on Monte-Carlo simulations is used for the reliability analysis of the examined logic families. A benefit of the differential circuit over standard single-ended is shown in case of complex systems. Moreover, analysis of reliability of different circuits and discussion on the optimal granularity of redundant blocks was made.

Details

Title Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density
Author(s) Stanisavljevic, Milos ; Schmid, Alexandre ; Leblebici, Yusuf
Published in International Joint Conference on Neural Networks (IJCNN)
Pages 2771-2778
Conference International Joint Conference on Neural Networks (IJCNN), Vancouver, BC, Canada, July 16-21
Date 2006
Publisher IEEE
Keywords
DOI https://doi.org/10.1109/IJCNN.2006.247183
Other identifier(s) View record in Web of Science
Additional link URL
Laboratories LSM
Record Appears in Scientific production and competences > STI - School of Engineering > IEM - Institut d'Electricité et de Microtechnique > LSM - Microelectronic Systems Laboratory
Peer-reviewed publications
Conference Papers
Work produced at EPFL
Published
Record creation date 2006-12-07

Actions

Preview