000096258 001__ 96258
000096258 005__ 20180317094731.0
000096258 037__ $$aCONF
000096258 245__ $$aComputer-aided method to measure the permittivity of microstrip substrates
000096258 260__ $$c1986
000096258 269__ $$a1986
000096258 336__ $$aConference Papers
000096258 700__ $$0242770$$g106782$$aF. Zürcher, J.
000096258 700__ $$aBarlatey, L.
000096258 700__ $$aGardiol, F. E.$$g105202$$0244000
000096258 773__ $$tMIOP'86
000096258 909CO $$pconf$$ooai:infoscience.tind.io:96258
000096258 909C0 $$0252091$$pLEMA$$xU10374
000096258 937__ $$aLEMA-CONF-1986-005
000096258 970__ $$aLEMA_F._Barlatey_Gardiol_jun_1986_7/LEMA
000096258 973__ $$sPUBLISHED$$aEPFL
000096258 980__ $$aCONF