Infoscience

Conference paper

Automatic determination of frequency response parameters, field distribution and distortion in microwave cavities, Workshop on Measurement Techniques in Microwaves and Electromagnetism

Sphicopoulos, T.
  • Presented at: Bern, Switzerland
  • Published in: IEEE Swiss Chapter MTT+ AP
  • Publication date: 1984

    Reference

    • LEMA-CONF-1984-002

    Record created on 2006-11-30, modified on 2016-08-08

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