Use of photoelectron microscopes as X-ray detectors for imaging and other applications

Hwu, Y.; Tsai, W. L.; Lai, B.; Mancini, D. C.; Je, J. H.; Noh, D. Y.; Youn, H. S.; Hwang, C. S.; Cerrina, F.; Swiech, W.; Bertolo, M.; Tromba, G.; Margaritondo, G.

doi:10.1016/S0168-9002(99)00757-3

Hwu, Y.; Tsai, W. L.; Lai, B.; Mancini, D. C.; Je, J. H.; Noh, D. Y.; Youn, H. S.; Hwang, C. S.; Cerrina, F.; Swiech, W.; Bertolo, M.; Tromba, G.; Margaritondo, G.

1999

Formats

Format
BibTeX
MARCXML
TextMARC
MARC
DublinCore
EndNote
NLM
RefWorks
RIS

Abstract

We demonstrate with practical tests that a photoelectron emission microscope (PEEM) can be advantageously used as a high-lateral-resolution detector of X-rays. The advantages of this approach are discussed, in particular for coherence-based techniques. (C) 1999 Published by Elsevier Science B.V. All rights reserved.

Details

Title Use of photoelectron microscopes as X-ray detectors for imaging and other applications

Author(s) Hwu, Y. ; Tsai, W. L. ; Lai, B. ; Mancini, D. C. ; Je, J. H. ; Noh, D. Y. ; Youn, H. S. ; Hwang, C. S. ; Cerrina, F. ; Swiech, W. ; Bertolo, M. ; Tromba, G. ; Margaritondo, G.

Published in Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment

Volume 437

Issue 2-3

Pages 516-520

Date 1999

ISSN 0168-9002

Keywords

SYNCHROTRON-RADIATION; SPECTROMICROSCOPY; CONTRAST; RESOLUTION; MEPHISTO; SURFACES

Note Acad Sinica, Inst Phys, Taipei, Taiwan. Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA. Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang, South Korea. Kwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju, South Korea. Kwangju Inst Sci & Technol, Ctr Elect Mat Res, Kwangju, South Korea. Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang, South Korea. Synchrotron Radiat Res Ctr, Hsinchu, Taiwan. Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA. Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL 61801 USA. Sincrotrone Trieste, I-34012 Trieste, Italy. Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Hwu, Y, Acad Sinica, Inst Phys, Taipei, Taiwan.
ISI Document Delivery No.: 257PJ

DOI https://doi.org/10.1016/S0168-9002(99)00757-3

Other identifier(s) View record in Web of Science

Laboratories LSE
LPRX

Record Appears in Scientific production and competences > SB - School of Basic Sciences > SB Archives > LSE - Laboratory of Photoelectron Spectroscopy
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPRX - X-Ray Physics Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published

Record creation date 2006-10-03