Use of photoelectron microscopes as X-ray detectors for imaging and other applications

We demonstrate with practical tests that a photoelectron emission microscope (PEEM) can be advantageously used as a high-lateral-resolution detector of X-rays. The advantages of this approach are discussed, in particular for coherence-based techniques. (C) 1999 Published by Elsevier Science B.V. All rights reserved.


Published in:
Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment, 437, 2-3, 516-520
Year:
1999
ISSN:
0168-9002
Keywords:
Note:
Acad Sinica, Inst Phys, Taipei, Taiwan. Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA. Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang, South Korea. Kwangju Inst Sci & Technol, Dept Mat Sci & Engn, Kwangju, South Korea. Kwangju Inst Sci & Technol, Ctr Elect Mat Res, Kwangju, South Korea. Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang, South Korea. Synchrotron Radiat Res Ctr, Hsinchu, Taiwan. Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA. Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL 61801 USA. Sincrotrone Trieste, I-34012 Trieste, Italy. Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Hwu, Y, Acad Sinica, Inst Phys, Taipei, Taiwan.
ISI Document Delivery No.: 257PJ
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 Record created 2006-10-03, last modified 2018-03-18


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