Journal article

Chemical contrast observed at a III-V heterostructure by scanning near-field optical microscopy

We observed chemical contrast with subwavelength resolution on a III-V heterostructure by a scanning near-field optical microscope (SNOM) working in the external reflection mode and coupled with a Free Electron Laser (FEL). SNOM reflectivity images revealed features that were not present in the corresponding shear-force (topology) images and are due to localized lateral changes in the optical properties of the sample. The data indicate an optical spatial resolution well below the diffraction limit of lambda/2 with most optical images having better lateral resolution than topographic images.



    CNR, Ist Stuttura Mat, I-00133 Rome, Italy. Vanderbilt Univ, Free Electron Laser Ctr, Nashville, TN 37235 USA. Univ Roma Tor Vergata, Dipartimento Fis, I-00185 Rome, Italy. Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA. Cricenti, A, CNR, Ist Stuttura Mat, Via Fosso Cavaliere 100, I-00133 Rome, Italy.

    ISI Document Delivery No.: 244NZ


    Record created on 2006-10-03, modified on 2017-05-12


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