Infoscience

Journal article

Analyses of surfaces and interfaces using the new generation of synchrotrons

Two years after their commissioning, the third-generation synchrotron source are ripe for a critical analysis of their performances, based on the broad practical experience of hundreds of scientists. The most relevant questions are: can one confirm that high brightness was the best choice for the sources of this new generation? Can one actually see the impact of the high brightness level on real applications? We try to answer these questions in the specific domain of surface and interface chemistry and physics, using a series of examples, primarily provided by the ELETTRA laboratory in Italy.

    Keywords: SPECTROMICROSCOPY ; RADIATION

    Note:

    Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Sincrotrone Trieste, I-34012 Trieste, Italy. Margaritondo, G, Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland.

    ISI Document Delivery No.: ZE337

    Reference

    Record created on 2006-10-03, modified on 2016-08-08

Fulltext

  • There is no available fulltext. Please contact the lab or the authors.

Related material