Analyses of surfaces and interfaces using the new generation of synchrotrons

Two years after their commissioning, the third-generation synchrotron source are ripe for a critical analysis of their performances, based on the broad practical experience of hundreds of scientists. The most relevant questions are: can one confirm that high brightness was the best choice for the sources of this new generation? Can one actually see the impact of the high brightness level on real applications? We try to answer these questions in the specific domain of surface and interface chemistry and physics, using a series of examples, primarily provided by the ELETTRA laboratory in Italy.


Published in:
Journal De Physique Iv, 7, C6, 31-40
Year:
1997
ISSN:
1155-4339
Keywords:
Note:
Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland. Sincrotrone Trieste, I-34012 Trieste, Italy. Margaritondo, G, Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland.
ISI Document Delivery No.: ZE337
Laboratories:




 Record created 2006-10-03, last modified 2018-03-18


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