Latest photoemission developments: Time resolution, microanalysis, order parameters

The third generation sources of soft X-rays, ALS and ELETTRA, have been producing data in surface and interface science for over two years. The impact of their ultrahigh brightness is quite evident, particularly as far as photoemission techniques are concerned. We illustrate this point with a short review of very recent examples from ELETTRA, in the specific domains of time resolution, high lateral resolution and high energy resolution.


Published in:
Surface Review and Letters, 4, 4, 695-701
Year:
1997
ISSN:
0218-625X
Keywords:
Note:
Sincrotrone trieste scpa,trieste,italy. univ trieste,dipartmento fis,i-34127 trieste,italy. Comelli, G, ECOLE POLYTECH FED LAUSANNE,INST PHYS APPL,CH-1015 LAUSANNE,SWITZERLAND.
ISI Document Delivery No.: YJ071
Laboratories:




 Record created 2006-10-03, last modified 2018-03-18


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