Application of Photoelectron Spectromicroscopy to a Systematic Study of Toxic and Natural Elements in Neurons

A systematic photoelectron spectromicroscopy study is presented of the spatial distribution of a toxic element, aluminium, iron or chromium, in neuron cultures, after exposure to a solution of the element. The study was performed by the X-ray secondary-emission microscopy (XSEM) version of photoelectron spectromicroscopy. The distribution of the elements was investigated with two complementary approaches: digital subtraction imaging and individual X-ray absorption spectra from microscopic areas. The results coherently indicate different localization patterns for different elements, and, in particular, extreme localization of aluminium to a few rare cells identifiable as Purkinje neurons. In the case of iron-exposed specimens, the distribution analysis was extended to naturally present phosphorus, and used to estimate the XSEM sensitivity.


Published in:
Journal of Synchrotron Radiation, 2, 106-112
Year:
1995
ISSN:
0909-0495
Keywords:
Note:
Cnr,ist struttura mat,i-00044 frascati,italy. univ wisconsin,dept phys,milwaukee,wi 53211. univ wisconsin,ctr synchrotron radiat,madison,wi 53706. cnr,ist neurobiol,i-00137 rome,italy. Destasio, g, ecole polytech fed lausanne,inst phys appl,ph ecublens,ch-1015 lausanne,switzerland.
ISI Document Delivery No.: RP379
Part 2
Laboratories:




 Record created 2006-10-03, last modified 2018-03-18


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