000090156 001__ 90156
000090156 005__ 20180318102450.0
000090156 037__ $$aBOOK_CHAP
000090156 245__ $$aNew Results from Maximum an X-Ray-Scanning Photoemission Microscope
000090156 269__ $$a1993
000090156 260__ $$bSpie - Int Soc Optical Engineering$$c1993
000090156 336__ $$aBook Chapters
000090156 490__ $$aProceedings of the Society of Photo-Optical Instrumentation Engineers (Spie)
000090156 500__ $$aISI Document Delivery No.: BX93Q
000090156 500__ $$aProceedings Paper
000090156 500__ $$aCONF ON SOFT X-RAY MICROSCOPY
000090156 500__ $$aJUL 19-21, 1992
000090156 500__ $$aSAN DIEGO, CA
000090156 500__ $$aSOC PHOTO OPT INSTRUMENTAT ENGINEERS
000090156 700__ $$aNg, W.
000090156 700__ $$aRaychaudhuri, A. K.
000090156 700__ $$aLiang, S.
000090156 700__ $$aWelnak, J.
000090156 700__ $$aWallace, J.
000090156 700__ $$aSingh, S.
000090156 700__ $$aCapasso, C.
000090156 700__ $$aCerrina, F.
000090156 700__ $$0240179$$aMargaritondo, G.$$g105753
000090156 700__ $$aUnderwood, J. H.
000090156 700__ $$aKortright, J. B.
000090156 700__ $$aPerera, R. C. C.
000090156 773__ $$j1741$$q296-305$$tSoft X-Ray Microscopy
000090156 909CO $$ooai:infoscience.tind.io:90156$$pSB$$pchapter
000090156 909C0 $$0252170$$pLSE$$xU10153
000090156 909C0 $$0252163$$pLPRX$$xU10144
000090156 937__ $$aLSE-CHAPTER-1993-004
000090156 937__ $$aLPRX-CHAPTER-1993-004
000090156 970__ $$a953/LSE
000090156 973__ $$aEPFL$$sPUBLISHED
000090156 980__ $$aCHAPTER