New Results from Maximum an X-Ray-Scanning Photoemission Microscope
1993
Details
Title
New Results from Maximum an X-Ray-Scanning Photoemission Microscope
Author(s)
Ng, W. ; Raychaudhuri, A. K. ; Liang, S. ; Welnak, J. ; Wallace, J. ; Singh, S. ; Capasso, C. ; Cerrina, F. ; Margaritondo, G. ; Underwood, J. H. ; Kortright, J. B. ; Perera, R. C. C.
Published in
Soft X-Ray Microscopy
Series
Proceedings of the Society of Photo-Optical Instrumentation Engineers (Spie)
Volume
1741
Pages
296-305
Date
1993
Publisher
Spie - Int Soc Optical Engineering
Note
ISI Document Delivery No.: BX93Q
Proceedings Paper
CONF ON SOFT X-RAY MICROSCOPY
JUL 19-21, 1992
SAN DIEGO, CA
SOC PHOTO OPT INSTRUMENTAT ENGINEERS
Proceedings Paper
CONF ON SOFT X-RAY MICROSCOPY
JUL 19-21, 1992
SAN DIEGO, CA
SOC PHOTO OPT INSTRUMENTAT ENGINEERS
Record Appears in
Scientific production and competences > Archives > SB - School of Basic Sciences > LSE - Laboratory of Photoelectron Spectroscopy
Scientific production and competences > Archives > SB - School of Basic Sciences > LPRX - X-Ray Physics Laboratory
LSE - Laboratory of Photoelectron Spectroscopy
Work produced at EPFL
Book chapters
Published
Scientific production and competences > Archives > SB - School of Basic Sciences > LPRX - X-Ray Physics Laboratory
LSE - Laboratory of Photoelectron Spectroscopy
Work produced at EPFL
Book chapters
Published