Infoscience

Book Chapter

New Results from Maximum an X-Ray-Scanning Photoemission Microscope

Ng, W.; Raychaudhuri, A. K.; Liang, S.; Welnak, J.; Wallace, J.; Singh, S.; Capasso, C.; Cerrina, F.; Margaritondo, G.; Underwood, J. H.
Show all 12 authors
  • Published in: Soft X-Ray Microscopy, vol. 1741, p. 296-305
  • Series: Proceedings of the Society of Photo-Optical Instrumentation Engineers (Spie)
  • Spie - Int Soc Optical Engineering, 1993

    Note:

    ISI Document Delivery No.: BX93Q

    Proceedings Paper

    CONF ON SOFT X-RAY MICROSCOPY

    JUL 19-21, 1992

    SAN DIEGO, CA

    SOC PHOTO OPT INSTRUMENTAT ENGINEERS

    Reference

    • LSE-CHAPTER-1993-004

    Record created on 2006-10-03, modified on 2017-05-12

Fulltext

  • There is no available fulltext. Please contact the lab or the authors.

Related material

Contacts

EPFL authors