Heterojunction Band Discontinuities Measured by Free-Electron Laser Internal Photoemission


Published in:
Physical Concepts and Materials for Novel Optoelectronic Device Applications Ii: International Symposium, 1985, 442-458
Year:
1993
Publisher:
Spie - Int Soc Optical Engineering
Note:
Ecole polytech fed lausanne, inst phys appl, lausanne, ch-1015 switzerland.
ISI Document Delivery No.: BZ62U
Proceedings Paper
International Symposium on Physical Concepts and Materials for Novel Optoelectronic Device Application 2
MAY 24-27, 1993
TRIESTE, ITALY
EUROPEAN OPT SOC, INT CTR SCI & HIGH TECHNOL, SOC PHOTO OPT INSTRUMENTAT ENGINEERS
PO BOX 10, BELLINGHAM, WA 98227-0010
Laboratories:




 Record created 2006-10-03, last modified 2018-03-18


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