X-Ray Microscopy and Spectromicroscopy

Progress in the instrumentation and, in particular, in the photon sources makes it possible to implement a number of established X-ray spectroscopies in a high-lateral-resolution mode. We discuss the general trends of this field, and then we present a detailed analysis of a particular and very interesting branch: photoemission spectromicroscopy. The results include a recent world record in lateral and energy resolution, obtained by the MAXIMUM system at Wisconsin, and microimages of materials science systems as well as of neuron networks.


Published in:
Acta Physica Polonica A, 82, 2, 283-294
Year:
1992
ISSN:
0587-4246
Keywords:
Note:
Margaritondo, g, ecole polytech fed lausanne,inst phys appl,ph ecublens,ch-1015 lausanne,switzerland.
ISI Document Delivery No.: JT095
Laboratories:




 Record created 2006-10-03, last modified 2018-03-18


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