X-Ray Secondary-Emission Microscopy (Xsem) of Neurons
We present the first X-ray secondary (photoelectron) emission microscopy (XSEM) pictures and video microimages of an uncoated and unstained neuron specimen. This novel kind of synchrotron radiation microscopy is suitable for local chemical analysis with a lateral resolution in the micron range. We explored the details of the neuron system, demonstrated chemical contrast by scanning the photon energy, studied in real time the photoelectron emitting properties of the specimen's components, and made preliminary tests of the radiation damage. These results significantly enhance the potential role of photoemission techniques in the life sciences and specifically in neurobiology.
- View record in Web of Science
Keywords: BIOPHYSICAL INSTRUMENTATION AND TECHNIQUES ; ELECTRON AND ION ; MICROSCOPES AND TECHNIQUES ; PHOTOEMISSION AND PHOTOELECTRON SPECTRA ; PHOTOELECTRON MICROSCOPY ; SYNCHROTRON RADIATION ; SPECTROMICROSCOPY ; NETWORKS ; SILICON ; AREA
Univ wisconsin,dept phys,milwaukee,wi 53211. univ wisconsin,ctr synchrotron radiat,stoughton,wi 53589. cnr,ist neurobiol,i-00100 rome,italy. ecole polytech fed lausanne,inst phys appl,ch-1015 lausanne,switzerland. Destasio, g, cnr,ist struttura mat,via enrico fermi 38,i-00044 frascati,italy.
ISI Document Delivery No.: JK284
Record created on 2006-10-03, modified on 2016-08-08