Infoscience

Journal article

Unrelaxation of the Semiconductor Surface at Low-Coverage Ag Inp(110) Interfaces as Determined by Photoemission Extended X-Ray-Absorption Fine-Structure

    Note:

    Univ wisconsin,ctr synchrotron radiat,stoughton,wi 53589. univ wisconsin,dept phys,stoughton,wi 53589. Choudhary, km, univ notre dame,dept mat sci & engn,notre dame,in 46556.

    ISI Document Delivery No.: CZ843

    Reference

    Record created on 2006-10-03, modified on 2016-08-08

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