Effects of Al and Ti Interlayers on Sb/(Hgcd)Te Interface Behavior


Published in:
Journal of Applied Physics, 65, 9, 3435-3440
Year:
1989
ISSN:
0021-8979
Note:
Univ wisconsin,madison,wi 53706. Davis, gd, martin marietta corp labs,1450 s rolling rd,baltimore,md 21227.
ISI Document Delivery No.: U2448
Laboratories:




 Record created 2006-10-03, last modified 2018-03-18


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