Effects of Al and Ti Interlayers on Sb/(HgCd)Te Interface Behavior
1989
Details
Title
Effects of Al and Ti Interlayers on Sb/(HgCd)Te Interface Behavior
Author(s)
Davis, G. D. ; McKinley, J. T. ; Kilday, D. G. ; Margaritondo, G.
Published in
Journal of Applied Physics
Volume
65
Issue
9
Pages
3435-3440
Date
1989
ISSN
0021-8979
Note
Univ wisconsin,madison,wi 53706. Davis, gd, martin marietta corp labs,1450 s rolling rd,baltimore,md 21227.
ISI Document Delivery No.: U2448
ISI Document Delivery No.: U2448
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Scientific production and competences > SB - School of Basic Sciences > SB Archives > LSE - Laboratory of Photoelectron Spectroscopy
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPRX - X-Ray Physics Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Scientific production and competences > SB - School of Basic Sciences > SB Archives > LPRX - X-Ray Physics Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2006-10-03