Infoscience

Journal article

Effects of Al and Ti Interlayers on Sb/(Hgcd)Te Interface Behavior

    Note:

    Univ wisconsin,madison,wi 53706. Davis, gd, martin marietta corp labs,1450 s rolling rd,baltimore,md 21227.

    ISI Document Delivery No.: U2448

    Reference

    • LSE-ARTICLE-1989-012

    Record created on 2006-10-03, modified on 2016-08-08

Fulltext

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