Effects of Thin Interlayers on Ag/(Hgcd)Te Interface Behavior


Published in:
Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films, 7, 3, 870-874
Year:
1989
ISSN:
0734-2101
Note:
Univ wisconsin,madison,wi 53706. Davis, gd, martin marietta corp labs,baltimore,md 21227.
ISI Document Delivery No.: U7153
Part 1
Laboratories:




 Record created 2006-10-03, last modified 2018-03-18


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