The Surface Core-Level Shifts in Synchrotron Radiation Photoemission Spectra as a Probe of Semiconductor Interface Morphology


Published in:
Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films, 3, 3, 976-977
Year:
1985
ISSN:
0734-2101
Note:
Univ wisconsin,dept phys,madison,wi 53706. univ wisconsin,dept elect & comp engn,madison,wi 53706.
ISI Document Delivery No.: AKX49
Laboratories:




 Record created 2006-10-03, last modified 2018-12-03


Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)