Infoscience

Journal article

Soft-X-Ray Photoemission-Study of Annealed Al-Overlayers on Gaas (110)

    Note:

    Xerox corp,webster res ctr,rochester,ny 14644. univ wisconsin,dept phys,madison,wi 53706. Katnani, ad, princeton univ,dept elect engn & comp sci,princeton,nj 08540.

    ISI Document Delivery No.: LV581

    Reference

    • LSE-ARTICLE-1981-006

    Record created on 2006-10-03, modified on 2016-08-08

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