Soft-X-Ray Photoemission-Study of Annealed Al-Overlayers on Gaas (110)


Published in:
Solid State Communications, 38, 12, 1269-1272
Year:
1981
ISSN:
0038-1098
Note:
Xerox corp,webster res ctr,rochester,ny 14644. univ wisconsin,dept phys,madison,wi 53706. Katnani, ad, princeton univ,dept elect engn & comp sci,princeton,nj 08540.
ISI Document Delivery No.: LV581
Laboratories:




 Record created 2006-10-03, last modified 2018-03-18


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