Dielectric response and structural features of Pb(Sc1/2Ta1/2)O-3 (PST) sol-gel derived thin films

Relaxor Pb(Sc-12/Ta-1/2)O-3 (PST) thin films have been prepared using mixed alkoxide and acetate precursors on TiO2/Pt/TiO2/SiO2/Si substrates. Relaxor behavior as evidenced by frequency dispersion of the permittivity as a function of temperature was observed, as well as a thickness dependence of the dielectric constant. The highest values of dielectric constant were observed for the thicker 650 nm samples displaying a room temperature dielectric constant near 2000, with a loss tangent of 0.3% at 1 kHz. The AC and DC field dependence of dielectric properties showed different signs of non-linearity, which is qualitatively explained in terms of polar region boundary movement. In addition, the measurement and analysis of pyroelectric properties under DC bias suggests the presence of polar regions in the ostensibly cubic paraelectric phase at 25degreesC.


Published in:
Journal of Electroceramics, 13, 1-3, 105-110
Year:
2004
ISSN:
1385-3449
Keywords:
Note:
Brinkman, K Swiss Fed Inst Technol, EPFL, Dept Mat, Ceram Lab, CH-1015 Lausanne, Switzerland Swiss Fed Inst Technol, EPFL, Dept Mat, Ceram Lab, CH-1015 Lausanne, Switzerland 886NR Times Cited:0 Cited References Count:21
Other identifiers:
Laboratories:




 Record created 2006-08-21, last modified 2018-01-27


Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)