Dielectric and piezoelectric properties of relaxor Pb(Sc1/2Nb1/2)O-3 thin films

Pure perovskite Pb(Sc1/2Nb1/2)O-3 thin films without pyrochlore phase were prepared by the sol-gel method on TiO2/Pt/TiO2/SiO2/Si substrates. Films exhibited (111) preferred orientation and columnar microstructure. Diffuse phase transitions with permittivity maximum decreasing in value and shifting toward higher temperature with increasing frequency and slim polarization-electric field hysteresis loops typical for relaxors were observed. The maximum field-induced piezoelectric d(33) coefficient measured with ac electric field of 14 kV/cm was 58 pm/V. The d(33)-dc electric field relation is virtually hysteresis free. (C) 2003 American Institute of Physics.


Published in:
Applied Physics Letters, 83, 8, 1614-1616
Year:
2003
ISSN:
0003-6951
Keywords:
Note:
Kuh, BJ Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, 373-1 Gusong Dong, Taejon, South Korea Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon, South Korea Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, IMXLC, Ceram Lab, CH-1015 Lausanne, Switzerland
713EN
Times Cited:2
Cited References Count:15
Other identifiers:
Laboratories:




 Record created 2006-08-21, last modified 2018-03-17


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