Investigation of electrical degradation effects in ferroelectric thin film based tunable microwave components

The impact of electrical stressing on the microwave performance of the SrTiO3 films deposited onto different substrates (MgO and LaAlO3) by pulsed laser deposition has been investigated. The most important characteristics of the tunable microwave components like tunability and loss tangent have been monitored. It has been found that electrical degradation effects, being sensitive to the device operating conditions and ferroelectric film properties, are large enough to affect the performance of ferroelectric-based tunable microwave devices within the expected operating time.


Publié dans:
Integrated Ferroelectrics, 49, 1, 103-112
Année
2002
ISSN:
1058-4587
Mots-clefs:
Note:
Astafiev, K Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Ceram Lab, CH-1015 Lausanne, Switzerland Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Ceram Lab, CH-1015 Lausanne, Switzerland Natl Renewable Energy Lab, Golden, CO 80401 USA
625TC
Times Cited:2
Cited References Count:13
Autres identifiants:
Laboratoires:




 Notice créée le 2006-08-21, modifiée le 2019-12-05


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