Comparison of several methods to characterise the high frequency behaviour of piezoelectric ceramics for transducer applications
Thickness mode resonances in commercial piezoelectric ceramics have been characterised as a function of frequency by two methods. The first is based on a fit on the electrical impedance for the fundamental and the overtones. This method has been applied to a large number of PZT ceramic samples and frequency dependence for all the parameters is investigated, in particular for the piezoelectric coefficient e(33). The second is based on the measurement of the mechanical displacement at the centre of the surface of a PZT ceramic disk. With a modified KLM scheme, this displacement is modelled. The dielectric, elastic and piezoelectric parameters are extracted and compared for the fundamental and the third overtone. The results are found to be in good agreement. (C) 2000 Elsevier Science B.V. All rights reserved.
Tran-Huu-Hue, LP LUSSI, GIP Ultrasons, 2 Bis Blvd Tonnelle,BP 3223, F-37032 Tours, France LUSSI, GIP Ultrasons, F-37032 Tours, France Ecole Polytech Fed Lausanne, Lab Ceram, CH-1015 Lausanne, Switzerland Ferroperm AS, Piezoceram Div, DK-3490 Kvistgard, Denmark
Cited References Count:12
Record created on 2006-08-21, modified on 2016-08-08