Ferroelectric thin films grown on tensile substrates: Renormalization of the Curie-Weiss law and apparent absence of ferroelectricity

A thermodynamic theory is used to calculate the dielectric properties of epitaxial thin films grown on cubic substrates imposing biaxial tension on the film prototypic cubic state. For such "tensile" substrates, the theory shows that, in a conventional plate-capacitor setup, the films should display only a monotonic variation or a broad maximum in the temperature dependence of the permittivity and an apparent absence of the hysteretic polarization behavior. Changes of the Curie-Weiss temperature and constant caused by the mechanical film/substrate interaction are also predicted. Theoretical results agree with the observed properties of columnar-structured BaTiO3 and SrTiO3 thin films grown on Si. (C) 1999 American Institute of Physics. [S0021-8979(99)01603-5].


Published in:
Journal of Applied Physics, 85, 3, 1698-1701
Year:
1999
ISSN:
0021-8979
Keywords:
Note:
Pertsev, Na RWTH Aachen Univ Technol, Inst Werkstoffe, D-52056 Aachen, Germany RWTH Aachen Univ Technol, Inst Werkstoffe, D-52056 Aachen, Germany KFA Julich GmbH, Forschungszentrum, Inst Festkorperforsch, Elektrokeram Mat, D-52456 Julich, Germany Ecole Polytech Fed Lausanne, Lab Ceram, CH-1015 Lausanne, Switzerland
158VB
Times Cited:64
Cited References Count:24
Laboratories:




 Record created 2006-08-21, last modified 2018-03-17


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