Infoscience

Journal article

Measurement of the effective transverse piezoelectric coefficient e(31,f) of AlN and Pb(Zr-x,Ti1-x)O-3 thin films

The effective piezoelectric transverse coefficient e(31,f) was measured on various lead zirconate-titanate (PZT) and aluminum nitride thin films. The measurement set-up is based on the collection of the electric charges created by the forced deflection of a Si cantilever coated with a piezoelectric material. The maximum value was obtained from a tetragonal composition of PZT (45/55 Zr/Ti ratio) and was equal to 8.3 C/m(2). The ALN layer exhibited 97% of the theoretical value calculated from single crystal data, i.e., e(31,f)- = 1.02 C/m(2) (C) 1999 Elsevier Science S.A. All rights reserved.

    Keywords: piezoelectric materials ; thin films

    Note:

    Dubois, Ma Swiss Fed Inst Technol, Lab Ceram, DMX LC Ecublens, CH-1015 Lausanne, Switzerland Swiss Fed Inst Technol, Lab Ceram, DMX LC Ecublens, CH-1015 Lausanne, Switzerland

    255KQ

    Times Cited:47

    Cited References Count:17

    Reference

    Record created on 2006-08-21, modified on 2016-08-08

Fulltext

  • There is no available fulltext. Please contact the lab or the authors.

Related material

Contacts

EPFL authors