PZT phase formation monitored by high-temperature X-ray diffractometry
The crystallisation kinetics of amorphous sol-gel PZT thin films were investigated using high-temperature X-my diffraction. Crystallisation for different isotherms was monitored as a function of time. Phase transformation data were obtained from integrated X-ray peak intensities which were calibrated based on image analysis of the surface microstructure of the samples at the end of the isothermal treatments. An activation energy of 310 kJ/mol was obtained without assuming a specific kinetic model. Front the transformation data, a TTT diagram was constructed for the ranges studied. (C) 1997 Elsevier Science Limited.
Babushkin, O Univ Lulea,Div Engn Mat,S-97187 Lulea,Sweden Ecole Polytech Fed Lausanne,Lab Ceram,Lausanne,Switzerland
Cited References Count:12
Record created on 2006-08-21, modified on 2016-08-08