Scanning Tunneling Microscopy and Potentiometry on a Semiconductor Heterojunction
1987
Details
Title
Scanning Tunneling Microscopy and Potentiometry on a Semiconductor Heterojunction
Author(s)
Muralt, P. ; Meier, H. ; Pohl, D. W. ; Salemink, H. W. M.
Published in
Applied Physics Letters
Volume
50
Issue
19
Pages
1352-1354
Date
1987
ISSN
0003-6951
Note
Ibm Corp,Div Res,Zurich Res Lab,Ch-8803 Ruschlikon,Switzerland
H1808
Cited References Count:5
H1808
Cited References Count:5
Laboratories
LC
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LC - Ceramics Laboratory
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2006-08-21