Infoscience

Journal article

Scanning Tunneling Microscopy and Potentiometry on a Semiconductor Heterojunction

    Note:

    Ibm Corp,Div Res,Zurich Res Lab,Ch-8803 Ruschlikon,Switzerland

    H1808

    Times Cited:81

    Cited References Count:5

    Reference

    Record created on 2006-08-21, modified on 2016-08-08

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