Scanning Tunneling Microscopy and Potentiometry on a Semiconductor Heterojunction


Published in:
Applied Physics Letters, 50, 19, 1352-1354
Year:
1987
ISSN:
0003-6951
Note:
Ibm Corp,Div Res,Zurich Res Lab,Ch-8803 Ruschlikon,Switzerland
H1808
Times Cited:81
Cited References Count:5
Laboratories:




 Record created 2006-08-21, last modified 2018-03-17


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