Semiconductor Interfaces Studied by Scanning Tunneling Microscopy and Potentiometry


Published in:
Scanning Microscopy, 67-73
Year:
1987
ISSN:
0891-7035
Note:
Muralt, P Free Univ Berlin,Inst Atom & Festkorperphys,Arnimallee 14,D-1000 Berlin 33,Fed Rep Ger
Suppl. 1
J9025
Times Cited:0
Cited References Count:15
Laboratories:




 Record created 2006-08-21, last modified 2018-03-17


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