Infoscience

Journal article

Semiconductor Interfaces Studied by Scanning Tunneling Microscopy and Potentiometry

    Note:

    Muralt, P Free Univ Berlin,Inst Atom & Festkorperphys,Arnimallee 14,D-1000 Berlin 33,Fed Rep Ger

    Suppl. 1

    J9025

    Times Cited:0

    Cited References Count:15

    Reference

    • LC-ARTICLE-1987-005

    Record created on 2006-08-21, modified on 2016-08-08

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