000087955 001__ 87955
000087955 005__ 20180127200455.0
000087955 0247_ $$2doi$$a10.1063/1.1835996
000087955 02470 $$2DAR$$a6387
000087955 02470 $$2ISI$$a000225620100041
000087955 037__ $$aARTICLE
000087955 245__ $$aStrain modulation of transport criticality in RuO2-based thick-film resistors
000087955 269__ $$a2004
000087955 260__ $$c2004
000087955 336__ $$aJournal Articles
000087955 500__ $$aVariation de l’exposant de percolation par déformation mécanique.
000087955 520__ $$aWe show that in RuO2–glass composites the nonuniversal resistivity exponent can be modulated by an applied mechanical strain, signaled by a logarithmic divergence of the piezoresistive response at the percolation threshold. We interpret this phenomenon as being due to a tunneling-distance dependence of the transport exponent, supporting therefore a theory of transport nonuniversality proposed some years ago. © 2004 American Institute of Physics. [DOI: 10.1063/1.1835996] 
000087955 6531_ $$aTechnologie des Couches Epaisses
000087955 6531_ $$atechnologie hybride couches épaisses résistances anisotropie conduction piézorésistance mécanisme percolation critique transport effet tunnel
000087955 700__ $$0241294$$aVionnet Menot, Sonia$$g133341
000087955 700__ $$0240278$$aGrimaldi, Claudio$$g121842
000087955 700__ $$0240512$$aRyser, Peter$$g115532
000087955 700__ $$0240386$$aMaeder, Thomas$$g102445
000087955 700__ $$aSträssler, Sigfrid
000087955 773__ $$j85$$k23$$q5619-5621$$tApplied Physics Letters
000087955 8564_ $$iINTERNAL$$uhttps://infoscience.epfl.ch/record/87955/files/2004 Vionnet piézorésistance criticalité.pdf$$xPUBLIC$$zn/a
000087955 909C0 $$0252100$$pLPM
000087955 909CO $$ooai:infoscience.tind.io:87955$$particle
000087955 917Z8 $$x102445
000087955 937__ $$aLPM-ARTICLE-2006-001
000087955 973__ $$aEPFL$$rREVIEWED$$sPUBLISHED
000087955 980__ $$aARTICLE