000087637 001__ 87637
000087637 005__ 20180127200408.0
000087637 0247_ $$2doi$$a10.1088/0022-3727/37/15/019
000087637 02470 $$2DAR$$a5576
000087637 02470 $$2ISI$$a000223510100019
000087637 037__ $$aARTICLE
000087637 245__ $$aA random-resistor network model of voltage trimming
000087637 269__ $$a2004
000087637 260__ $$c2004
000087637 336__ $$aJournal Articles
000087637 500__ $$aArticle théorique sur l’ajustement par impulsions électriques de résistances.
000087637 520__ $$aIn industrial applications, the controlled adjustment (trimming) of resistive  elements via the application of high voltage pulses is a promising technique,  with several advantages with respect to more classical approaches such as  the laser cutting method. The microscopic processes governing the response  to high voltage pulses depend on the nature of the resistor and on the  interaction with the local environment. Here we provide a theoretical  statistical description of voltage discharge effects on disordered composites  by considering random resistor network models with different properties and  processes due to the voltage discharge. We compare standard percolation  results with biased percolation effects and provide a tentative explanation of  the different scenarios observed during trimming processes.
000087637 6531_ $$aTechnologie des couches épaisses
000087637 6531_ $$arésistances
000087637 6531_ $$athick-film resistors
000087637 6531_ $$aajustement électrique
000087637 6531_ $$aimpulsions haute tension
000087637 6531_ $$ahigh-voltage pulses
000087637 6531_ $$atheory
000087637 6531_ $$amodels
000087637 700__ $$0240278$$aGrimaldi, Claudio$$g121842
000087637 700__ $$0240386$$aMaeder, Thomas$$g102445
000087637 700__ $$0240512$$aRyser, Peter$$g115532
000087637 700__ $$aSträssler, Sigfrid
000087637 773__ $$j37$$q2170-2174$$tJournal of Physics D
000087637 8564_ $$zURL
000087637 8564_ $$iINTERNAL$$uhttps://infoscience.epfl.ch/record/87637/files/2004 Grimaldi modèle ajustement résistances par implusions.pdf$$xRESTRICTED$$zn/a
000087637 909C0 $$0252100$$pLPM
000087637 909CO $$ooai:infoscience.tind.io:87637$$particle
000087637 917Z8 $$x102445
000087637 937__ $$aLPM-ARTICLE-2004-016
000087637 970__ $$aGrimaldiA04_/LPM
000087637 973__ $$aEPFL$$rREVIEWED$$sPUBLISHED
000087637 980__ $$aARTICLE