A model of transport nonuniversality in thick-film resistors

We propose a model of transport in thick-film resistors which naturally explains the observed nonuniversal values of the conductance exponent t extracted in the vicinity of the percolation transition. Essential ingredients of the model are the segregated microstructure typical of thick-film resistors and tunneling between the conducting grains. Nonuniversality sets in as a consequence of wide distribution of interparticle tunneling distances. © 2003 American Institute of Physics.


Published in:
Applied Physics Letters, 83, 1, 189-191
Year:
2003
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Note:
Modélisation du fait que l’exposant de percolation n’est pas 2 (valeur universelle).
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 Record created 2006-06-22, last modified 2018-01-27

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