A model of transport nonuniversality in thick-film resistors
We propose a model of transport in thick-film resistors which naturally explains the observed nonuniversal values of the conductance exponent t extracted in the vicinity of the percolation transition. Essential ingredients of the model are the segregated microstructure typical of thick-film resistors and tunneling between the conducting grains. Nonuniversality sets in as a consequence of wide distribution of interparticle tunneling distances. © 2003 American Institute of Physics.
Modélisation du fait que l’exposant de percolation n’est pas 2 (valeur universelle).
Record created on 2006-06-22, modified on 2016-08-08