Gauge Factor Enhancement Driven by Heterogeneity in Thick-film Resistors
2001
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Details
Title
Gauge Factor Enhancement Driven by Heterogeneity in Thick-film Resistors
Author(s)
Grimaldi, C. ; Ryser, P. ; Strässler, S.
Published in
Journal of Applied Physics
Volume
90
Pages
322
Date
2001
Keywords
Other identifier(s)
DAR: 1907
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Laboratories
LPM
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LPM - Laboratory of Microengineering for Manufacturing
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2006-06-22