3D Position Measurement under Microscope using Pattern Matching
1998
Details
Title
3D Position Measurement under Microscope using Pattern Matching
Author(s)
Boillat, P. ; Sulzmann, A. ; Jacot, J.
Published in
Bulletin de l'Association Suisse de Microtechnique (ASMT/SGMT)
Issue
22
Date
1998
Keywords
Laboratories
LPM
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LPM - Laboratory of Microengineering for Manufacturing
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Peer-reviewed publications
Work produced at EPFL
Journal Articles
Published
Record creation date
2006-06-22