Details
Title
Quality metric design: A closer look
Author(s)
Winkler, S.
Published in
Proc. SPIE Human Vision and Electronic Imaging Conference
Series
SPIE Proceedings, 3959
Pages
37-44
Date
2000
Publisher
SPIE
Keywords
Other identifier(s)
View record in Web of Science
Laboratories
LTS
Record Appears in
Scientific production and competences > STI - School of Engineering > STI Archives > LTS - Signal Processing Laboratory
Conference Papers
Work produced at EPFL
Published
Conference Papers
Work produced at EPFL
Published
Record creation date
2006-06-14